Features¶

Simulated results¶

Calculated generic quantities
- Fractions of primary electrons that are transmitted, backscattered and absorbed
- Secondary particle generation probabilities
- Average energy deposited within each body of the sample
- Average energy of photons that reach each detector.
Angular distribution of electrons and photons
Energy distribution of backscattered and transmitted electrons and photons
Photon spectra with continuum
Intensities of characteristic X-ray lines (generated and emitted).
- Total intensity
- Total fluorescence intensity
- Intensity from primary photons (from electron interactions)
- Fluorescence intensity from characteristic x-rays
- Fluorescence intensity from bremsstralung quanta
$\phi(\rho z)$ distribution of generated and emitted characteristic lines
Spatial distribution of x-ray emission within the volume of a parallelepiped (the scoring box) with a Cartesian mesh, and for a given interval of x-ray energies

Cross-platform graphical interface to setup PENEPMA simulations
Define basic microanalysis geometries
- Substrate
- Spherical inclusion (hemisphere in substrate)
- Multi-layers (with and without a substrate)
- Grain-boundaries (vertical interfaces)
Setup of different x-ray detectors
Display all the results
Export all results to CSV file or directly to Excel/OpenOffice
Export spectra to EMSA/MAS spectrum file
Use of a set of default with optimized simulation parameters
Setup a batch of simulations
Launch simulation directly from the interface and track its progress